Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Which insights about data structure make it possible to analyze the very large databases collected by Internet, business, scientific, and government applications?
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Ruixiong Tian, Zhe Xiang, et al.
Qinghua Daxue Xuebao/Journal of Tsinghua University
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Thomas R. Puzak, A. Hartstein, et al.
CF 2007