P. Alnot, D.J. Auerbach, et al.
Surface Science
Paper
Scanning tunneling microscopy
Abstract
An overview of the status of Scanning Tunneling Microscopy (STM) is given. So far, the method has been applied mainly to surface structures. Examples are given for reconstructions on metal and semiconductor surfaces and adsorbate structures. It will become evident that the technique is likewise applicable to chemical investigations of surfaces on an atomic scale. © 1985.
Related
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
Michiel Sprik
Journal of Physics Condensed Matter
J.V. Harzer, B. Hillebrands, et al.
Journal of Magnetism and Magnetic Materials