A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME
A short overview of the history of scanning tunneling microscopy and the principle of local probe methods is given. A selection of applications illustrates the unique and attractive features and the wide interdisciplinary nature of local probe methods. They could be the beginning of a new era in surface science. © 1994.
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
Mark W. Dowley
Solid State Communications
Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry