Sung Ho Kim, Oun-Ho Park, et al.
Small
Paper
Secondary defect formation in bonded silicon-on-insulator after boron implantation
Abstract
No abstract available.
Related
Fernando Marianno, Wang Zhou, et al.
INFORMS 2021
H.D. Dulman, R.H. Pantell, et al.
Physical Review B
Shaoning Yao, Wei-Tsu Tseng, et al.
ADMETA 2011