Conference paper
SCANNING TUNNELING MICROSCOPY.
G. Binnig, H. Rohrer
ICPS Physics of Semiconductors 1984
Elastic compliance data are reported for thin plates of SrTiO3. An analysis is presented in terms of two spatially separated phases, the one of low symmetry residing near the surface. From the thickness of the surface layers, a static correlation length ξ=ξ0(TTc-1)ν, with ξ0=(0.35±0.02) μm and ν=-0.68±0.03, is deduced. © 1982 The American Physical Society.
G. Binnig, H. Rohrer
ICPS Physics of Semiconductors 1984
H. Rohrer, H.J. Scheel
Physical Review Letters
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Zeitschrift für Physik B Condensed Matter
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