L. Krusin-Elbaum, K.Y. Ahn, et al.
JVSTA
We demonstrate here that bilayer films consisting of Si and transition metals with a layer thickness of 15-40 nm are promising materials for archival optical storage. They show a large optical reflectivity change before and after silicide formation, have a long lifetime at room temperature, and are nontoxic.
L. Krusin-Elbaum, K.Y. Ahn, et al.
JVSTA
W.K. Chu, H. Kraütle, et al.
Applied Physics Letters
K.N. Tu
JVSTA
F. Nava, T. Tien, et al.
Journal of Applied Physics