Effects of growth direction on sige/si heteroepitaxy
T.S. Kuan, Subramanian S. Iyer
SPIE Advances in Semiconductors and Superconductors 1990
SiGe epitaxial growth on Si has been of interest for a number of years. In this work we consider the addition of 1 to 6% C into both Si and SiGe epitaxial material. We have used a solid, and a gas source, (acetylene), within a solid source SiGe molecular beam epitaxy system to produce a C flux. We have produced high-crystalline-quality Si1-yCy and Si1-x-yGexCy material using both approaches. In addition we demonstrate strain-symmetrical short-period superlattice structures grown on (100) Si with high Ge compositions ranging from 20% up to 100% Ge, at 100% Ge the Ge/Si1-xCy superllatice has an interface mismatch of 7%.
T.S. Kuan, Subramanian S. Iyer
SPIE Advances in Semiconductors and Superconductors 1990
C.-Y. Ting, M. Wittmer, et al.
VLSI Science and Technology 1983
A.R. Powell, K. Eberl, et al.
Journal of Crystal Growth
S.C. Jain, P. Balk, et al.
Microelectronic Engineering