Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011
Let K be a subspace of Rn and let K⊥ be the orthogonal complement of K. Rockafellar has shown that certain properties of K may be characterized by considering the possible patterns of signs of the nonzero components of vectors of K and of K⊥. Such considerations are shown to lead to the standard characterization theorem for discrete linear Chebyshev approximation as well as to several results on uniqueness of solutions. A method is given for testing uniqueness of a given solution. A special case related to graph theory is discussed and combinatorial methods are given for solving and testing for uniqueness. © 1976.
Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011
Hang-Yip Liu, Steffen Schulze, et al.
Proceedings of SPIE - The International Society for Optical Engineering
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
Peter Wendt
Electronic Imaging: Advanced Devices and Systems 1990