Conference paper
A survey of defects in strained Si layers
S.W. Bedell, H. Chen, et al.
MRS Proceedings 2004
A nanofabrication technique was developed to facilitate current-perpendicular-to-plane (CPP) transport measurements on magnetic multilayer pillar structures with diameters as narrow as 100 nm. Pillars with diameters ranging from 250-500 nm were also made.
S.W. Bedell, H. Chen, et al.
MRS Proceedings 2004
J.Z. Sun
Journal of Applied Physics
Jerng-Sik Song, Chin-An Chang
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
G.J. Norga, F. Vasiliu, et al.
Journal of Materials Research