Conference paper
A study of negative bias temperature instability (NBTI) in pFETs
Sufi Zafar, James Stathis, et al.
ECS Meeting 2005
No abstract available.
Sufi Zafar, James Stathis, et al.
ECS Meeting 2005
Yan Xiong, James Huang, et al.
ACS Nano
Sufi Zafar, A. Kerber, et al.
VLSI Technology 2014
Sufi Zafar, Alessandro Callegari, et al.
Journal of Applied Physics