Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
Structural investigations of the Co layer in Cu/Co/Cu/NiFe/FeMn spin valves have been performed by NMR. In addition to hcp stacking faults in an overall fcc structure, a significant amount of bulk defects, which may affect the magnetoresistance, is also present. The interface planes seem rather intermixed although they include some wide islands of pure elements. © 1993.
T.N. Morgan
Semiconductor Science and Technology
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