A. Gangulee, F.M. D'Heurle
Thin Solid Films
A structure analysis of the Si(111)2 1 surface is performed using extensive new low-energy electron-diffraction data (12 beams). Although the -bonded chain model in its original form shows gross disagreement with low-energy electron diffraction, a modification of that structure gives moderate agreement. The major modifications are a buckling in the outer chain and an overall compression. © 1984 The American Physical Society.
A. Gangulee, F.M. D'Heurle
Thin Solid Films
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
K.A. Chao
Physical Review B