Patterning of highly conducting polyaniline films
T. Graham, A. Afzali, et al.
Microlithography 2000
This paper presents novel perturbation bounds for generalized symmetric positive definite eigenvalue problems. The bounds provide the insights for an observed computational phenomenon that is not easily explained by the existing bounds developed previously. Using the new bounds, we provide an analysis of a subspace Newton type procedure for computing a few extreme eigenpairs for generalized symmetric positive definite systems. A preconditioned version of this subspace iterative method is also studied. © 1999 Elsevier Science Inc. All rights reserved.
T. Graham, A. Afzali, et al.
Microlithography 2000
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Shashanka Ubaru, Lior Horesh, et al.
Journal of Biomedical Informatics
Peter Wendt
Electronic Imaging: Advanced Devices and Systems 1990