Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Paper

01 Jan 1988

Summary Abstract: The role of interface states on Schottky behavior

View publication

Abstract

No abstract available.

Conference paper

NEW RELIABLE STRUCTURE FOR HIGH TEMPERATURE MEASUREMENT OF SILICON WAFERS USING A SPECIALLY ATTACHED THERMOCOUPLE.

S. Cohen, T.O. Sedgwick, et al.

MRS Proceedings 1983

Conference paper

Investigation of the numerical accuracy of transmission line-based transient analysis of high-speed interconnects and cables

Andreas C. Cangellaris, Karen M. Coperich, et al.

EMC 2001

Paper

Uranium alkoxide chemistryV. Synthesis, characterization and interconversion of uranium(IV) tert-butoxide complexes

William G. Van der Sluys, Alfred P. Sattelberger, et al.

Polyhedron

Conference paper

Growth and transport properties of multilayer superconducting films of Nd_1.83Ce_0.17CuO_x / YBa₂Cu₃O_7-δ

A. Gupta, R. Gross, et al.

SPIE Advances in Semiconductors and Superconductors 1990

View all publications