Conference paperA novel scan chain diagnostics technique based on light emission from leakage currentPeilin Song, Franco Stellari, et al.IEEE ITC 2004
Conference paperStudy of Critical Factors Determining Latchup Sensitivity of ICs using Emission MicroscopyFranco Stellari, Peilin Song, et al.ISTFA 2003
Conference paperEvaluating PICA capability for future low voltage SOI chipsFranco Stellari, Peilin Song, et al.ISTFA 2008
Conference paperAutomatic registering and stitching of TEM/STEM image mosaicsChung-Ching Lin, Franco Stellari, et al.ISTFA 2013