Electronic Device Failure Analysis

Paper

01 Nov 2016

Superconducting single-photon detector enables time-resolved emission testing of low-voltage scaled ICS

Conference paper

Study of Critical Factors Determining Latchup Sensitivity of ICs using Emission Microscopy

Franco Stellari, Peilin Song, et al.

ISTFA 2003

Conference paper

On-chip power supply noise measurement using time resolved emission (TRE) waveforms of light emission from off-state leakage current (LEOSLC)

Franco Stellari, Peilin Song, et al.

IEEE ITC 2009

Conference paper

1D and 2D Time-Resolved Emission Measurements of Circuits Fabricated in 14 nm Technology Node

Franco Stellari, Andrea Bahgat Shehata, et al.

IPFA 2020

Conference paper

"Invited"-Picosecond imaging circuit analysis of ULSI microprocessors

Moyra K. Mc Manus, Peilin Song

IMS 2002

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