H. Rohrer
Microelectronic Engineering
Paper
Surface imaging by scanning tunneling microscopy
Abstract
We discuss the potential of a new technique for surface imaging on an atomic scale: scanning tunneling microscopy. Examples for 3D topographies of surfaces and work-function profiles are given. © 1983.
Related
M.I. Lutwyche, M. Despont, et al.
Applied Physics Letters
Paper
Nanotechnology
G. Binnig, H. Rohrer
Compressed Air
Conference paper
"Millipede": A MEMS-based scanning-probe data-storage system
E. Eleftheriou, Th. Antonakopoulos, et al.
APMRC 2002