Hsinyu Tsai, Stefano Ambrogio, et al.
VLSI Technology 2019
We introduce M/# as a metric for characterizing holographic memory systems. M/# is the constant of proportionality between diffraction efficiency and the number of holograms squared. Although M/# is a function of many variables in a holographic recording system, it can be measured from the recording and erasure of a single hologram. We verify experimentally that the diffraction efficiency of multiple holograms follows the prediction of M/# measured from a single hologram. © 1996 Optical Society of America.
Hsinyu Tsai, Stefano Ambrogio, et al.
VLSI Technology 2019
Maria Sanz-Paz, Cyrine Ernandes, et al.
CLEO/Europe-EQEC 2019
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EDTM 2017
Maria Sanz-Paz, Cyrine Ernandes, et al.
Nano Letters