Arnon Amir, Michael Lindenbaum
IEEE Transactions on Pattern Analysis and Machine Intelligence
No abstract available.
Arnon Amir, Michael Lindenbaum
IEEE Transactions on Pattern Analysis and Machine Intelligence
Daniel J. Costello Jr., Pierre R. Chevillat, et al.
ISIT 1997
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
Jaione Tirapu Azpiroz, Alan E. Rosenbluth, et al.
SPIE Photomask Technology + EUV Lithography 2009