Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
Two techniques for determining threshold are compared to capatitance date. Errors from using 77 K thresholds are determined and the effect on measurements on NA+ doped samples estimated. © 1980, All rights reserved.
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
G. Will, N. Masciocchi, et al.
Zeitschrift fur Kristallographie - New Crystal Structures
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings
R.W. Gammon, E. Courtens, et al.
Physical Review B