Joerg Appenzeller, R. Martel, et al.
IEEE Electron Device Letters
Paper
TEM and atom probe microscopy in the development of magnetic multilayer nano-structures
Abstract
No abstract available.
Related
P. Rice, R.E. Stoller
MRS Proceedings 2000
M.J. Carey, S. Maat, et al.
Applied Physics Letters
B.D. Schrag, A. Anguelouch, et al.
Applied Physics Letters