Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
The atomic structure of the {001} surface of Ni3Al has been determined by LEED (low-energy electron diffraction) intensity analysis to correspond to simple truncation of the bulk structure with the Ni-Al mixed layer on top rather than the pure Ni layer. The first interlayer spacing is essentially equal to the bulk interlayer spacing between {001} planes. First-principles calculations of the cohesive energies of slabs terminating in the two types of layers also indicate that the mixed layer termination is more stable. © 1985.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007