Conference paper
Characterization of line width variation
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
Paper
The best strong uniqueness constant for a multivariate Chebyshev polynomial
Abstract
No abstract available.
Related
Yixiong Chen, Weichuan Fang
Engineering Analysis with Boundary Elements
Guillaume Buthmann, Tomoya Sakai, et al.
ICASSP 2025
Zhihua Xiong, Yixin Xu, et al.
International Journal of Modelling, Identification and Control