Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
The crystalline perfection of Sn-doped GaAs crystals grown by the horizontal Bridgman technique was found to be dependent on the crystal growth direction. The highest perfection occurred for crystals grown near the <013> direction. Portions of both seeded and unseeded doped crystals grown in this direction were found to be dislocation-free. Also, undoped crystals seeded in the <013> direction were dislocation-free. © 1971, by The Electrochemical Society, Inc. All rights reserved.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
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Surface Review and Letters
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Physical Review B