P.E. Batson, J.F. Morar
Physical Review Letters
The system of computer control of STEM operation for EELS acquisition is described. The ability to obtain analytical information from 1 nm sized areas during a 15 min integration time is illustrated. The system of hardware and software is discussed in general terms to highlight the organizational philosophy which allows complex and adaptable behavior with a minimum of construction effort. © 1982.
P.E. Batson, J.F. Morar
Physical Review Letters
P.E. Batson, A.J. Craven
Physical Review Letters
P.E. Batson
Microscopy and Microanalysis
A.C. Callegari, K. Babich, et al.
ECS Meeting 2007