Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
Measurements of thermoelectric power versus temperature of (CH)x doped with various concentrations of AsF5 are reported. These reflect the semiconductor-metal transition at ∼ 1% doping. The "pristine" thermopower is consistent with the conductivity-derived activation energy of 0.35 eV, and a residual defect/impurity carrier concentration of 0.1%. An analysis of the conductivity based on these data indicates that, while the disorder is certainly important, it is not the cause of the transition. © 1980.
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
R. Ghez, J.S. Lew
Journal of Crystal Growth
John G. Long, Peter C. Searson, et al.
JES
A. Gangulee, F.M. D'Heurle
Thin Solid Films