Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
We report the characterization of thin films of MoO3 and their implementation on a micromachined silicon-based structure to achieve considerably low power consumption. The sensing layer is capable of detecting NO2 up to a few ppm with considerably short response and recovery times. Investigation of structural features of the films is carried out by X-ray diffraction and electron microscopy. © 1998 Elsevier Science S.A. All rights reserved.
Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films