K. Keiji Kanazawa, A. Diaz, et al.
Journal of the Chemical Society, Chemical Communications
Paper
Thin film x-ray spectrometry
Abstract
No abstract available.
Related
Thomas C. Clarke, Roy H. Geiss, et al.
Journal of the Chemical Society, Chemical Communications
Tung Symon Chang, David F. Kyser, et al.
IEEE T-ED
Kenji Murata, David F. Kyser, et al.
Journal of Applied Physics