T.N. Jackson, P. Solomon, et al.
IEEE T-ED
Pseudomorphic (In,Ga)As layers are used in GaAs-based semiconductor- insulator- semiconductor (SIS) structures to shift the threshold voltage from the natural, near-zero value. The threshold voltage is shifted positively for (In,Ga)As gate layers, and negatively for (In,Ga)As channel layers, by the (In,Ga)As/GaAs conduction-band offset. The thermionic and field emission barrier heights agree with shifts obtained in capacitance-voltage characteristics. The structures withstand implant activation anneals, establishing a simple technology to create either enhancement or depletion-mode devices.
T.N. Jackson, P. Solomon, et al.
IEEE T-ED
B. Laikhtman, P. Solomon
Journal of Applied Physics
H. Baratte, D.C. La Tulipe, et al.
IEDM 1985
F. Fang, T.P. Smith III, et al.
Surface Science