Conference paperHot-carrier induced instability of 0.5 μm CMOS devices patterned using synchrotron X-ray lithographyC.C.-H. Hsu, L.K. Wang, et al.IRPS 1989
Conference paperA comparative study of hot-carrier instabilities in p- and n-type poly gate MOSFETsC.C.-H. Hsu, D.S. Wen, et al.IEDM 1989
Conference paperEpitaxial-base double-poly self-aligned bipolar transistorsE. Ganin, T.C. Chen, et al.IEDM 1990