T.H. Ning
Journal of Applied Physics
Paper
TP-A1 Shallow-Level Electron Traps in SiO2
Abstract
No abstract available.
Related
Conference paper
Submicron high performance bipolar technology
T.C. Chen, J.D. Cressler, et al.
VLSI Technology 1989
T.H. Ning
IEEE Transactions on Electron Devices
Conference paper
Technologies to further reduce soft error susceptibility in SOI
P. Oldiges, R.H. Dennard, et al.
IEDM 2009