Conference paper
A small test generator for large designs
Sandip Kundu, Leendert M. Huisman, et al.
IEEE ITC 1992
Paper
TRIM: Testability Range by Ignoring the Memory
Abstract
The testability by random test patterns of faults in the logic surrounding embedded RAM's is studied. Upper and lower bounds on the probability that a fault is caught are obtained by analyzing a modified, purely combinational circuit without the RAM. This analysis can be done with standard testability analysis techniques. The analysis is applied to an embedded two-port RAM. © 1988 IEEE
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