Hans Becker, Frank Schmidt, et al.
Photomask and Next-Generation Lithography Mask Technology 2004
We review current attemps at understanding the scaling behavior of fully developed turbulence through studying simple, scalar, translationally invariant, deterministic coupled-map interface models. The universality classes of such model systems are discussed. © 1992.
Hans Becker, Frank Schmidt, et al.
Photomask and Next-Generation Lithography Mask Technology 2004
John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
Heng Cao, Haifeng Xi, et al.
WSC 2003
Guo-Jun Qi, Charu Aggarwal, et al.
IEEE TPAMI