T.N. Rhodin, J.E. Demuth
Japanese Journal of Applied Physics
Paper
Ultrahigh-vacuum sample transfer device with low-temperature capability
Abstract
The design of a novel sample transfer device for use in surface studies in an ultrahigh-vacuum environment is discussed. The principle feature of this design is a broad sample temperature range (∼32-∼1270 K).
Related
W.A. Thompson
Physics Letters A
J.E. Demuth, H. Ibach
Surface Science
P.N. Sanda, J.M. Warlaumont, et al.
Physical Review Letters