Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
The (SN)x valence band structure, for polycrystalline films as well as for single crystal samples, has been studied using He I and He II resonance radiation. In angle-resolved photoemission energy distributions from single crystals, structure in the spectra is selectively enhanced offering a possibility of assigning the photoemission as originating from particular regions of the Brillouin Zone. The observed onset of photoemission 0.2 eV below the Fermi edge is discussed. © 1977.
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Michiel Sprik
Journal of Physics Condensed Matter
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
E. Burstein
Ferroelectrics