Hans Becker, Frank Schmidt, et al.
Photomask and Next-Generation Lithography Mask Technology 2004
Results correlating observed crosstalk-induced color artifacts as a function of the four signal-driving schemes used in high-resolution color thin-film-transistor liquid crystal displays (TFT/LCDs) are presented and theoretically explained. Experimental characterization has been carried out on a high-resolution 146-dot-per-inch, 262K-color, 5.5-in.-diagonal, 480 × 640-pixel (VGA) display. Mathematical modeling and simulations have been developed that help explain the crosstalk-induced color artifacts. The modeling is particularly advantageous for quantifying various tradeoffs between front-of-screen quality and signal-driving schemes when scaling pixel density toward higher-resolution TFT/LCDs.
Hans Becker, Frank Schmidt, et al.
Photomask and Next-Generation Lithography Mask Technology 2004
Gal Badishi, Idit Keidar, et al.
IEEE TDSC
Robert G. Farrell, Catalina M. Danis, et al.
RecSys 2012
Preeti Malakar, Thomas George, et al.
SC 2012