Protecting big blue from rogue subatomic particles
- Ethan H. Cannon
- A.J. KleinOsowski
- et al.
- 2007
- ICICDT 2007
Conference paper
Publications
86 results for Phil Oldiges
Simulation study of multiple FIN FinFET design for 32nm technology node and beyond
- Xinlin Wang
- Andres Bryant
- et al.
- 2007
- SISPAD 2007
Conference paperSingle-event-upset critical charge measurements and modeling of 65 nm silicon-on-insulator latches and memory cells
- David F. Heidel
- Kenneth P. Rodbell
- et al.
- 2006
- IEEE TNS
PaperModeling single-event upsets in 65-nm silicon-on-insulator semiconductor devices
- A.J. KleinOsowski
- Phil Oldiges
- et al.
- 2006
- IEEE TNS
PaperChallenges and opportunities for high performance 32 nm CMOS technology
- J. Sleight
- I. Lauer
- et al.
- 2006
- IEDM 2006
Conference paperPoly-Si/AlN/HfSiO stack for ideal threshold voltage and mobility in sub-100 nm MOSFETs
- K.-L. Lee
- M.M. Frank
- et al.
- 2006
- VLSI Technology 2006
Conference paperSimulation study on channel length scaling of high performance partially depleted metal gate and poly gate SOI MOSFETs
- Wang Xinlin
- Andres Bryant
- et al.
- 2006
- SISPAD 2006
Conference paperOptimal UTB FD/SOI device structure using thin BOX for sub-50-nm SRAM design
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2006
- IEEE Electron Device Letters
PaperOptimization of high κ gate stacks with poly-Si, FUSI and metal electrodes
- R. Jammy
- V. Narayanan
- et al.
- 2005
- ISTC 2005
Conference paperSimulation analysis of series resistance for SOI MOSFET in nanometer regime
- Xinlin Wang
- Phil Oldiges
- et al.
- 2005
- SISPAD 2005
Conference paper