Publications

14 results for H. Föll

Stoichiometric and structural origin of electronic states at the Pd2Si-Si interface
- - P.S. Ho
  - P.E. Schmid
  - et al.
- 1981
- Physical Review Letters
Paper
Weak‐beam contrast of stacking faults in transmission electron microscopy
- - H. Föll
  - C.B. Carter
  - et al.
- 1980
- physica status solidi (a)
Paper
Direct TEM determination of intrinsic and extrinsic stacking fault energies of silicon
- - H. Föll
  - C.B. Carter
- 1979
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Paper
TEM observations on grain boundaries in sintered silicon
- - H. Föll
  - D. Ast
- 1979
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Paper