Current transport across a grain boundary in polycrystalline semiconductorsChih-Yuan LuNicky Chau-Chun Lu1983Solid-State ElectronicsPaper
Scaling Limitations of Monolithic Polycrystalline-Silicon Resistors in VLSI Static RAM's and LogicNicky Chau-Chun LuLevy Gerzberget al.1982IEEE T-EDPaper
Scaling Limitations of Monolithic Polycrystalline-Silicon Resistors in VLSI Static RAM's and LogicLevy GerzbergJames D. Meindl1982IEEE Journal of Solid-State CircuitsPaper