Publications

2 results for Sachin Seth

Trade-offs between RF performance and total-dose tolerance in 45-nm RF-CMOS
- - Rajan Arora
  - En Xia Zhang
  - et al.
- 2011
- IEEE TNS
Paper
Impact of source/drain contact and gate finger spacing on the RF reliability of 45-nm RF nMOSFETs
- - Rajan Arora
  - Sachin Seth
  - et al.
- 2011
- IRPS 2011
Conference paper