CPAM: A common power analysis methodology for high-performance VLSI design
- J.Scott Neely
- Howard H. Chen
- et al.
- 2000
- IEEE Topical Meeting EPEPS 2000
Conference paper
Publications
3 results for James S. Neely
Interconnect and circuit modeling techniques for full-chip power supply noise analysis
- Howard H. Chen
- J. Scott Neely
- 1998
- IEEE Transactions on Components Packaging and Manufacturing Technology Part B
PaperA Room Temperature 0.1 µm CMOS on SOI
- Ghavam G. Shahidi
- Carl A. Anderson
- et al.
- 1994
- IEEE Transactions on Electron Devices
Paper