Data analysis techniques for CMOS technology characterization and product impact assessment
- Anne Gattiker
- Manjul Bhushan
- et al.
- 2006
- IEEE ITC 2006
Conference paper
Publications
25 results for Anne Gattiker
Ring oscillator based technique for measuring variability statistics
- Manjul Bhushan
- Mark B. Ketchen
- et al.
- 2006
- ICMTS 2006
Conference paperHigh-performance CMOS variability in the 65-nm regime and beyond
- Kerry Bernstein
- David J. Frank
- et al.
- 2006
- IBM J. Res. Dev
PaperIC failure mechanisms yesterday, today, tomorrow: Implications from test to DFM
- Anne Gattiker
- 2006
- ISPD 2006
Conference paperRing oscillators for CMOS process tuning and variability control
- Manjul Bhushan
- Anne Gattiker
- et al.
- 2006
- IEEE Trans Semicond Manuf
PaperDefects yesterday, today and tomorrow: Implications for test
- Anne Gattiker
- 2006
- DBT 2006
Conference paperPhoton emission microscopy of inter/intra chip device performance variations
- S. Polonsky
- M. Bhushan
- et al.
- 2005
- ESREF 2005
Conference paperRandom and systematic defect analysis using IDDQ signature analysis for understanding fails and guiding test decisions
- Phil Nigh
- Anne Gattiker
- 2004
- IEEE ITC 2004
Conference paperDiagnosis meets physical failure analysis: How long can we succeed?
- Anne Gattiker
- 2004
- IEEE ITC 2004
Conference paperPower supply transient signal analysis for defect-oriented test
- Jim Plusquellic
- Abhishek Singh
- et al.
- 2003
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Paper