Publications

3 results for D. Smeets

Simultaneous real-time x-ray diffraction spectroscopy, Rutherford backscattering spectrometry, and sheet resistance measurements to study thin film growth kinetics by Kissinger plots
- - D. Smeets
  - J. Demeulemeester
  - et al.
- 2008
- Journal of Applied Physics
Paper
Nucleation and diffusion during growth of ternary Co1-x Nix Si2 thin films studied by complementary techniques in real time
- - D. Smeets
  - J. Demeulemeester
  - et al.
- 2008
- Journal of Applied Physics
Paper
The role of lattice mismatch and kinetics in texture development: Co _1-xNi_xSi₂ thin films on Si(100)
- - D. Smeets
  - A. Vantomme
  - et al.
- 2008
- Journal of Applied Physics
Paper