Publications

4 results for N. Olsson

200 and 300 MeV/nucleon nuclear reactions responsible for single-event effects in microelectronics
- - H. Jäderström
  - Yu. Murin
  - et al.
- 2008
- Physical Review C - Nuclear Physics
Paper
A detector system for studying nuclear reactions relevant to Single Event Effects
- - Yu. Murin
  - Yu. Babain
  - et al.
- 2007
- Nucl. Instrum. Methods Phys. Res
Paper
Inverse kinematics studies of intermediate-energy reactions relevant for SEE and medical problems
- - J. Aichelin
  - Ch. Bargholtz
  - et al.
- 2004
- ND 2004
Conference paper
Single-event upsets in microelectronics
- - Henry H.K. Tang
  - Nils Olsson
- 2003
- MRS Bulletin
Paper