Publications

3 results for Enhai Zhao

Gate-induced-drain-leakage current in 45-nm CMOS technology
- - Xiaohin Yuan
  - Jae-Eun Park
  - et al.
- 2008
- IEEE T-DMR
Paper
Characterization and analysis of gate-induced-drain-leakage current in 45 nm CMOS technology
- - Xiaobin Yuan
  - Jae-Eun Park
  - et al.
- 2007
- IIRW 2007
Conference paper
Substrate bias effects in vertical SiGe HBTs fabricated on CMOS-compatible thin film SOI
- - Tianbing Chen
  - Marco Bellini
  - et al.
- 2005
- BCTM 2005
Conference paper