Calculating the error in long term oxide reliability estimates
- B.P. Linder
- J.H. Stathis
- et al.
- 2001
- IRPS 2001
Conference paper
Publications
169 results for James Stathis
Calculating the error in long term oxide reliability estimates
- B.P. Linder
- J.H. Stathis
- et al.
- 2001
- IRPS 2001
Conference paperPhysical and predictive models of ultra thin oxide reliability in CMOS devices and circuits
- J.H. Stathis
- 2001
- IRPS 2001
Conference paperPhysical and predictive models of ultra thin oxide reliability in CMOS devices and circuits
- J.H. Stathis
- 2001
- IRPS 2001
Conference paperSoftening of breakdown in ultra-thin gate oxide nMOSFETs at low inversion layer density
- S. Lombardo
- F. Crupi
- et al.
- 2001
- Annual Proceedings - Reliability Physics (Symposium)
PaperPhotoluminescence characterization of defects in thermal oxide
- Hiroyuki Nishikawa
- James H. Stathis
- 1999
- MRS Proceedings 1999
Conference paperBreakdown measurements of ultra-thin SiO2 at low voltage
- J.H. Stathis
- A. Vayshenker
- et al.
- 2000
- VLSI Technology 2000
Conference paperUltra-thin oxide reliability for ULSI applications
- Ernest Y. Wu
- James H. Stathis
- et al.
- 2000
- Semiconductor Science and Technology
PaperGate oxide breakdown under Current Limited Constant Voltage Stress
- B.P. Linder
- J.H. Stathis
- et al.
- 2000
- Digest of Technical Papers-Symposium on VLSI Technology
PaperAspects of defects in silica related to dielectric breakdown of gate oxides in MOSFETs
- Peter E. Blöchl
- James H. Stathis
- 1999
- Physica B: Condensed Matter
Paper