Compact modeling of stress effects in scaled CMOSChi-Chao WangWei Zhaoet al.2009SISPAD 2009Conference paper
Modeling of layout-dependent stress effect in CMOS designChi-Chao WangWei Zhaoet al.2009ICCAD 2009Conference paper
Finite-point-based transistor model: A new approach to fast circuit simulationMin ChenWei Zhaoet al.2009IEEE Transactions on VLSI SystemsPaper
Rigorous extraction of process variations for 65-nm CMOS designWei ZhaoFrank Liuet al.2009IEEE Trans Semicond ManufPaper
Fast statistical circuit analysis with finite-point based transistor modelMin ChenWei Zhaoet al.2007DATE 2007Conference paper