The strength of BEOL structures fabricated using low K materials and its impact on CPI failures
- Thomas M. Shaw
- Xiao Hu Liu
- et al.
- 2015
- IIRW 2015
Conference paper
Publications
48 results for Xiao Hu Liu
Breakdown data generation and in-die deconvolution methodology to address BEOL and MOL dielectric breakdown challenges
- F. Chen
- Carole Graas
- et al.
- 2015
- Microelectronics Reliability
PaperFirst realization of the piezoelectronic stress-based transduction device
- Josephine B. Chang
- Hiroyuki Miyazoe
- et al.
- 2015
- Nanotechnology
PaperThe piezoelectronic stress transduction switch for very large-scale integration, low voltage sensor computation, and radio frequency applications
- I.-B. Magdû
- Xiao Hu Liu
- et al.
- 2015
- Applied Physics Letters
PaperPathway to the Piezoelectronic Transduction Logic Device
- Paul Solomon
- Brian A. Bryce
- et al.
- 2015
- Nano Letters
PaperThe PiezoElectronic switch: A path to low energy electronics
- Paul Solomon
- Brian A. Bryce
- et al.
- 2013
- E3S 2013
Conference paperGiant piezoresistive On/Off ratios in rare-earth chalcogenide thin films enabling nanomechanical switching
- Matthew Copel
- Marcelo A. Kuroda
- et al.
- 2013
- Nano Letters
PaperPerformance and reliability of thick Cu interconnects for RF and analog/mixed signal technology
- E. Cooney
- Jeff Gambino
- et al.
- 2013
- MRS Spring Meeting 2013
Conference paperThe piezoelectronic transistor: A nanoactuator-based post-CMOS digital switch with high speed and low power
- Dennis M. Newns
- B.G. Elmegreen
- et al.
- 2012
- MRS Bulletin
PaperHigh response piezoelectric and piezoresistive materials for fast, low voltage switching: Simulation and theory of transduction physics at the nanometer-scale
- Dennis M. Newns
- Bruce G. Elmegreen
- et al.
- 2012
- Advanced Materials
Paper