Publications

2 results for Steven Hung

Compressive Diffusion Break Stressor for Gate-All-Around Nanosheet pFET Transistor Performance Improvement
- - S. Hung
  - S. Mochizuki
  - et al.
- 2025
- VLSI Technology and Circuits 2025
Conference paper
Novel Materials and Processes in Replacement Metal Gate for Advanced CMOS Technology
- - Ruqiang Bao
  - Steven Hung
  - et al.
- 2018
- IEDM 2018
Conference paper