Patterning strategies for gate level tip-tip distance reduction in SRAM cell for 45nm and beyondHaoren ZhuangHelen Wanget al.2007ISTC 2007Conference paper
Novel enhanced stressor with graded embedded SiGe source/drain for high performance CMOS devicesJ.-P. HanH. Utomoet al.2006IEDM 2006Conference paper
Selection of attenuated phase shift mask compatible contact hole resists for KrF optical lithographyZhijian G. LuYuping Cuiet al.1999SPIE Advances in Resist Technology and Processing 1999Conference paper
Plasma-etching processes for ULSI semiconductor circuitsM. ArmacostP.D. Hohet al.1999IBM J. Res. DevPaper