Publications

24 results for M. McManus

Non-invasive timing analysis of IBM G6 microprocessor L1 cache using backside time-resolved hot electron luminescence
- - S. Polonsky
  - D.R. Knebel
  - et al.
- 2000
- ISSCC 2000
Conference paper
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis
- - M. McManus
  - J.A. Kash
  - et al.
- 2000
- Microelectronics Reliability
Paper
Picosecond Imaging Circuit Analysis of the IBM G6 Microprocessor Cache
- - Moyra McManus
  - Pia Sanda
  - et al.
- 1999
- ISTFA 1999
Conference paper
Diagnosis and characterization of timing-related defects by time-dependent light emission
- - D.R. Knebel
  - P.N. Sanda
  - et al.
- 1998
- IEEE ITC 1998
Conference paper