Characterizing the VCO Jitter Due to the digital simultaneous switching noise
- Tian Xia
- Peilin Song
- et al.
- 2005
- GLSVLSI 2005
Conference paper
Publications
3 results for Tian Xia
Low-frequency noise of 90nm nFETs: Hot-carrier degradation and deuterium effect
- M. Erturk
- R. Anna
- et al.
- 2004
- SiRF 2004
Conference paperDelay chain based programmable jitt+er generator
- Tian Xia
- Peilin Song
- et al.
- 2004
- ETS 2004
Conference paper